• Dutco Tennant LLC, PO Box 233, Dubai, U.A.E.
Scanning Electron Microscope Material Science Testing Solutions

Explore the microscopic world with unparalleled clarity using a Scanning Electron Microscope (SEM).

  • All-in-one Model of SEM-EDS
  • Intuitive User Interface
  • Auto Functions
  • 3-axis motorized sample stage
  • Auto Focus, Contrast, Brightness, Gun Alignment
  • Functions Maximum Sample Size Up To 60mm in dia, 45mm(H)
  • Magnification Up To x150,000
  • Easy Navigation With the 'Navigation Mode'
  • Precise Control With a Joystick And the 'Driving Mode'
  • Integrated BSE Detector And LV Mode(optional) Available


Features

  • Navigation View
  • Special Multi Sample Holder
  • Signal Mixing (SE+BSE)Dual Display(SE/BSE)
  • Integrated BSE
  • Line Profile
  • Image Process
  • Measurement Tool
  • Remote Control

Application

  • Smartphone
  • Semiconductor
  • Chemical
  • Construction
  • Energy
  • Metal Material
  • Bioengineering