• Dutco Tennant LLC, PO Box 233, Dubai, U.A.E.
Surface Analysis Mass spectrometers Research Equipment

Description

Hiden Analytical has unique configurations for surface analysis of Solid Samples. Depth profiling under UHV, Surfance composition by AutoSIMS, Surfance contamination by UHV/SNMS workstation FIB-SEM system is used in elemental mapping, numerous other applications are covered for surface science.
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  • UHV TPD
  • SIMS
  • End point detection in ion beam etch
  • Elemental imaging – 3D mapping.
Mass spectrometers for Gas Analysis, Mass spectrometers Plasma Diagnostics, Mass spectrometers Vacuum Analysis.