Description
Hiden Analytical has unique configurations for surface analysis of Solid Samples. Depth profiling under UHV, Surfance composition by AutoSIMS, Surfance contamination by UHV/SNMS workstation FIB-SEM system is used in elemental mapping, numerous other applications are covered for surface science.| Social Media Share |
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- UHV TPD
- SIMS
- End point detection in ion beam etch
- Elemental imaging – 3D mapping.
Mass spectrometers for Gas Analysis, Mass spectrometers Plasma Diagnostics, Mass spectrometers Vacuum Analysis.
